FTIR Spectrometers FT/IR-X Series
FT/IR-4X Research-grade model
It is research-grade in performance, functionality and expandability, and supports high resolution, high S/N, high sensitivity detectors, extending measurement wavenumber, microscopy with linear array detector, and rapid scan. The sample compartment is 200 mm wide, the same width as that of a large model, and can accommodate conventional accessories, including those from third parties.
FT/IR-6X/8X High-end model
The FT/lR-6X and FT/lR-8X spectrometers offer a highly configurable optical system applicable to virtually any FTIR application, from simple Mid IR measurement to more complex analysis in the farthest reaches of the electromagnetic spectrum. Research-based measurements are easily performed on the FT/lR-6X or FT/lR-8X spectrometers with options such as full-vacuum, gold-coated optics, rapid & step scan and FT-Raman for more advanced experiments.
Exchangeable elements combined with full automation can be used for spectral measurement from 25,000 cm-1 to less than 20 cm-1 without touching the system. The FT/lR-6X and FT/lR-8X spectrometers are compatible with a range of vacuum and configurable emission ports to perform experiments outside the sample compartment, and are also compatible with our comprehensive range of IR microscopes.
Superior performance
- High signal-to-noise ratio (up to 55,000: 1)
- High resolution (up to 0.07 cm-1)
- High wavenumber precision (25,000 to 20 cm-1)
Enhanced robustness and reliability
- Corner-cube mirrors for stable measurement
- Maintenance-free design
- Self-diagnosis and validation
- Base isolation structure
Outstanding flexibility
- Optional detectors
- Expandable measurement wavenumber range
- Rapid scan option
- Large space sample compartment
- Compatible with microscope
Advanced hardware
- Stable interferometer
- AccuTrac™ DSP control
- Stable optical bench
- Excellent signal-to-noise ratio
- High resolution measurement
Expandable system for user
- Vacuum option
- Wavelength range
- Rapid scan and step scan options
- IR microscope options
Sophisticated software
- Self-diagnosis function and validation
- Navigation function
- Method function